Scanning electron microscope (SEM) is an observation method. It does not use electromagnetic lens to amplify the image but uses a narrow focused-high-energy electron beam to scan the sample, which in a similar way of television photography.
Scanning electron microscope (SEM) is an observation method. It does not use electromagnetic lens to amplify the image but uses a narrow focused-high-energy electron beam to scan the sample, which in a similar way of television photography.